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[NewPaper Published]
"Numerical simulation of birefringence imaging for threading dislocations in4H-SiC wafers"
March 31, 2025
Our new research paper has been published in Acta Materialia. This is the latest report on the evaluation
technique for crystal defects in power device SiC wafers by polarised light observation and the result of the joint
research with Associate Professor Shunta Harada ，Nagoya University.
| Journal | Acta Materialia |
| Paper Title | Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence |
| Author | Shunta Harada, Yasutaka Matsubara, Shohei Hayashi, Michio Kawase, Keisuke Seo, Seiya Mizutani, Yuya Mizutani, Seiji Mizutani, Kenta Murayama |
| URL | https://www.sciencedirect.com/science/article/pii/S1359645425002150?via%3Dihub *The paper is open access. |
Our joint research was supported by the NEDO project to support young researchers (JPNP20004).
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